The J.A. Woollam company has over 30 years of experience in spectroscopic ellipsometry.  We offer a wide range of ellipsometers for nondestructive materials characterization including, thin film thickness (single and multi-layer), optical constants, composition, growth/etch rates and more. We have instruments available for research and manufacturing metrology covering spectral ranges from vacuum ultra-violet to far infrared. We  pride ourselves in creating the most advanced, high quality and reliable ellipsometers.