In a common Integrated Circuit (IC) packaging assembly, electrical interconnection is accomplished by fine Cu wires bonded to Al bonding pads microfabricated on an IC chip and external contact pins of the PCB board…
The corrosion mechanism of Aluminum bond pads in a chloride ion environment is reported and hydrogen evolution was found for the first time as the main cathodic reaction to drive rapid Al bond pad corrosion reaction, leading to fatal defects of Cu ball lift-offs…
Wire bonding interconnect is one of the most common packaging technologies due to its wide applicability, cost-effective and well-proven manufacturing process…